Mass Spectrometric and FT-IR Spectroscopic Imaging to Probe Organic Ligands and Their Binding Schemes on Nanocrystals

摘要

We report an analysis method to identify conjugated ligands and their binding states on semiconductor nanocrystals based on their molecular informaion. Surface science techniques, such as ToF-SIMS and FT-IR spectroscopy are adopted based on the micro aggregated sampling method.