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Low-Overhead Run-Time Memory Leak Detection and Recovery

机译:低开销运行时内存泄漏检测和恢复

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Memory leaks are known to be a major cause of reliability and performance issues in software. This paper describes a run-time scheme that detects and removes memory leaks with minimal performance overhead and with no modifications to application source code. The scheme consists of a first stage where a pattern recognition technique proactively detects subtle memory leaks, followed by a more resource-intensive second stage that scans the memory space of an application and removes detected memory leaks. The pattern recognition technique in the first stage is based on the multivariate state estimation technique (MSET) which provides accurate detection of subtle memory leaks with very little overhead. The second stage is only activated when problems are identified by the first stage. For our prototype, this second stage is based on debugging and analysis tools provided by Solaris 10. Due to the low-overhead impact of the first stage, the system can be monitored for memory leaks without incurring noticeable performance degradation. We present and discuss some results from our unique proactive detection and debugging methodology.
机译:已知内存泄漏是软件中可靠性和性能问题的主要原因。本文介绍了一种运行时方案,可检测和删除具有最小性能开销的内存泄漏,并且没有对应用程序源代码的修改。该方案包括第一阶段,其中图案识别技术主动地检测到微妙的存储器泄漏,然后是扫描应用程序的存储空间的更资源密集的第二阶段,并删除检测到的存储器泄漏。第一阶段中的模式识别技术基于多元状态估计技术(MSET),其提供精确地检测微妙的内存泄漏,其开销很小。第二阶段仅在第一阶段识别出问题时激活。对于我们的原型,第二阶段是基于Solaris 10提供的调试和分析工具。由于第一阶段的低开销影响,可以监控系统的内存泄漏,而不会产生显着的性能下降。我们展示并讨论了我们独特的主动检测和调试方法的结果。

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