It has been a great challenge to reliability engineers to evaluate the reliability of theirproducts within an affordable amount of time and effort. Accelerated tests (ATs) combined with censoring have been effectively used for this purpose. ATs are further classified into accelerated life tests (ALTs) and accelerated degradation tests (ADTs). In the former, failure times of test units are observed while, in the latter, their performance characteristics are measured over time. In this paper, the literature on planning ADTs is reviewed with respect to the test scenario, assumed degradation model, and analysis method employed. Finally, recommendations for future research directions are provided.
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