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Using small-angle neutron scattering to probe the local magnetic structure of perpendicular magnetic recording media

机译:使用小角度散射探测垂直磁记录介质的局部磁结构

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Small-angle neutron scattering (SANS) has been used to measure the local magnetic structure of perpendicular media consisting of granular CoCrPt-SiO_x thin films. The dimensions of the magnetic structures determined by SANS are consistent with the physical grain sizes suggested by transmission electron microscopy measurements, but yield additional information on magnetic structure within the grains, including the existence of a much smaller magnetic core. The results are similar to those recently obtained on longitudinal magnetic recording media, but with the addition of strong interference terms due to the narrower distribution of grain sizes in these samples.
机译:已经使用小角度散射(SAN)来测量由粒状Cocrpt-SiO_x薄膜组成的垂直介质的局部磁性结构。由SAN确定的磁性结构的尺寸与通过透射电子显微镜测量建议的物理晶粒尺寸一致,但是在谷物内产生有关磁性结构的附加信息,包括存在更小的磁芯。结果类似于最近在纵向磁记录介质上获得的结果,但由于这些样品中晶粒尺寸的分布较窄,因此增加了强烈的干扰术。

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