首页> 外文会议>International Conference on Advanced Ceramics and Composites >DIELECTRIC PROPERTIES OF BaTiO_3 CERAMICS AND CURIE-WEISS AND MODIFIED CURIE-WEISS AFFECTED BY FRACTAL MORPHOLOGY
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DIELECTRIC PROPERTIES OF BaTiO_3 CERAMICS AND CURIE-WEISS AND MODIFIED CURIE-WEISS AFFECTED BY FRACTAL MORPHOLOGY

机译:BATIO_3陶瓷和居里 - Weiss的介电性能和修饰的CURIE-WEISS受分形形态的影响

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The BaTiO_3-ceramics doped with Ho_2O_3 ranging from 0.01 to 1.0 wt%, regarding their microstructural and dielectric characteristics, were investigated in this paper. Doped BaTiO_3 were prepared using conventional method of solid state sintering at 1320°C for four hours. As BaTiO_3 doped ceramics concerns, SEM analysis has shown that in samples doped with a rare-earth ions low level, the grain size is ranged from 20-40μm, while with the higher dopant concentration the abnormal grain growth is inhibited and the grain size is ranged between 2-10 μm. Dielectric measurements were carried out as a function of temperature up tol80°C . The low doped samples sintered at 1320°C , display the high value of dielectric permittivity, at room temperature 2300°C for 0.01Ho/BaTiO_3. A nearly flat permittivity-response was obtained in specimens with higher (1.0 wt%) additive content. The Curie temperature of doped samples is ranged from 124 to 129°C . The Curie constant for all series of samples decreases with increase of dopant concentration and the lowest values were measured from samples doped with 0.01 wt% of aditive. Some parameters as Curie constant (C), Curie temperature (Tc) and a critical exponent of nonlinearity (f) are calculated by using a Curie-Weiss low. New aspect here is fractal correction, introduced as slight variation of temperature T entered from outside, due to three fractal factors α_s,α_p and α_M being responsible for complex geometry of both morphologic and dynamic nature. This correction, naturally has impact on the Curie-Weiss low, which is stressed in this paper.
机译:掺杂有Ho_2O_3范围为0.01至1.0重量%,就其微观结构和介电特性的BaTiO_3陶瓷,在本文中进行了研究。掺杂BaTiO_3使用固态烧结的常规方法在1320℃下四小时制备。作为BaTiO_3掺杂陶瓷的担忧,SEM分析表明,样品中掺杂有稀土离子低电平时,晶粒大小由20-40μm范围,而具有较高掺杂浓度的异常晶粒生长被抑制,并且晶粒尺寸为2-10微米之间。介电测量进行了如温度高达tol80℃的功能。在1320℃下烧结的低掺杂的样品,显示介电常数的高值,在室温下2300℃下0.01Ho / BaTiO_3。在试样具有较高的(1.0重量%)添加剂含量得到一种几乎平坦的介电常数 - 响应。掺杂样品的居里温度从124到129范围℃。对于所有系列样品的居里常数与掺杂剂浓度的增加而降低,并从掺杂有aditive的0.01%(重量)的样品测得的最低值。一些参数作为居里常数(C),居里温度(Tc)和非线性(F)的一个临界指数通过使用居里 - 外斯低计算。这里新的方面是分形校正,引入从外部输入的温度T的微小的变化,由于以下三个因素的分形α_s,α_p和α_M负责两个形态学和动态性质的复杂的几何形状。这种校正,自然对居里 - 外斯低,这是本文强调的影响。

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