A System for the Characterization of High Resolution DACs and ADCs

摘要

This paper describes the system under construction at I.N.Ri.M. for the characterization of high resolution DACs and ADCs. The main measurement instrument used as a reference is a high precision sampling multimeter, which is properly configured for the measurement of both dc and ac voltages supplied by the DAC under test. A proper voltage pattern is supplied to the ADC under test by means of a multichannel output board put inside a computer, combined by suitable supplementary electronic circuits. The constructed signal is then measured by the multimeter and analyzed by the computer.