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A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller

机译:一种用于通过共享控制器进行测试,调试和表征不同类型的嵌入存储器的硅可配置测试流程和算法的新方法

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In present day System-on-Chips (SOC), a large part (~70%) is occupied by memories. The overall yield of the So C relies heavily on the memory yield. To minimize the test and diagnosis effort, we present a system for silicon configurable test flow and algorithms for different types of memories including multi-port memories, through a shared controller. It supports manufacturing tests as well as diagnosis and electrical AC characterisation of memories. With low area overhead, the proposed microcode based configurable controller gives the test engineer freedom to do complete testing on-chip with few micro-codes.
机译:在现今的系统上(SOC),大部分(〜70%)被记忆占据。所以C的总体产量严重依赖于记忆产量。为了最大限度地减少测试和诊断工作,我们通过共享控制器提出了一种用于不同类型存储器的硅可配置测试流程和算法,包括多端口存储器。它支持制造测试以及存储器的诊断和电气交流表征。具有低区域开销,所提出的基于微码的可配置控制器为测试工程师自由提供了几个微型代码的芯片上的芯片上的完整测试。

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