Research on CCD Photoelectric Thickness Measurement System

摘要

Based on to design optical focusing and imagery system with He-Ne laser as illuminant, optical trigonometry measurement principle and wok principle of linear CCD were introduced in this paper. Using CCD as photoelectric conversion element and microprocessor as controller, non-contact thickness measurement instrument was constructed. The principle of measurement system was inclined trigonometry measurement principle and CCD was photoelectric conversion element. The time order driving circuit and the peripheral circuit of CCD were designed.