A NEW CROSSBAR EMBEDDED STRUCTURE FOR IMPROVEDATTENUATION CHARACTERISTICS ON LOSSY MEDIA

摘要

A general characterization procedure based on the extraction of the characteristic impedance and propagation constant for analyzing a single MIS(Metal-Insulator-Semiconductor) transmission line used. In thispaper, an analysis for a new substrate shielding MISstructure consisting of grounded crossbars at the interfacebetween Si and Sio2 layer using the Finite-DifferenceTime-Domain(FDTD) technique is presented. In order toreduce the substrate effects on the transmission linecharacteristics, a shielding structure consisting ofgrounded crossbar lines over time-domain signal has beenexamined. The extracted, distributed frequency-dependenttransmission line parameters and correspondingequivalent circuit parameters as well as quality factorhave been examined as function of frequency. It is shownthat the quality factor of the transmission line can beimproved without significant changes in the characteristicimpedance and effective dielectric constant.