Emittance measurement Using Duo Image Pattern of Cherenkov Radiation on DC-SC photo injector

摘要

A novel method to measure the emittance of electron beam is described using Cherenkov radiation. The image patterns of the Cherenkov radiation are formed both in the focal plane and image plane of an achromatic lens with long focus. Both the angular spread and radial distribution of the e-beam are obtained by processing the two patterns and in this way the beam RMS emittance is directly resulted. The emittance of the electron beam produced by the DC-SC photo-injector at Peking University is simulated and a He-Ne laser experiment is presented and discussed in this paper. On the beam line the quadrupole scanning technique is also used to verify this new method.