A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs

摘要

An Application-Dependent test strategy to be used by an FPGA user is presented which requires only 3 test configurations. In this specific strategy, the interconnect is first tested by modifying the logic block configuration and preserving the interconnect configuration. Then, the used logic blocks are fully tested by modifying the interconnect configuration. Results for some benchmark applications mapped into the Xilinx FPGAs are also provided.