首页> 外文会议>International symposium on processing and fabrication of advanced materials >Thermoelectric Properties of ReSi_(1.75) Based Silicides ―Property Improvements Through Defect Engineering
【24h】

Thermoelectric Properties of ReSi_(1.75) Based Silicides ―Property Improvements Through Defect Engineering

机译:通过缺陷工程,Resi_(1.75)硅化物的热电性能 - 磨损改善

获取原文

摘要

(1) The crystal structure of ReSi_(1.75) is determined to be monoclinic with the space group Cm (mc44) due to the ordered arrangement of vacancies on Si sites in the underlying C11_b lattice. The crystal contains four differently oriented domains; two domains related with each other by the 90°-rotation about the c-axis of the underlying C11_b lattice and twin domains for each of the two domains. (2) Upon alloying ReSi_(1.75) with Mo, an incommensurate microstructure, in which two block layers with different chemical compositions and vacancy concentrations stack randomly along in the parent C11_b lattice, appears. (3) Upon alloying ReSi_(1.75) with Ru, a shear-type microstructure, in which two neighboring domains are sheared (shifted) with each other on (101) by the vector of 1/8 in order to increase the Si vacancy concentration, appears. (4) The thermoelectric properties of ReSi_(1.75) are highly anisotropic. The value of electrical resistivity is higher for along than for. Its electrical conduction is of n-type when measure along while it is of p-type when measured along. Such anisotropy may come from anisotropy in the electronic structure due to its rather complicated crystal structure as well as from a complex microstructure. (5) Although the value of Seebeck coefficient along is moderately high (150-200 μV/K), it is very high along (250-300 μV/K). The value of thermal conductivity is rather isotropic and reasonably small. As a result, a very high value of dimensionless figure of merit (ZT) of 0.7 is achieved at 1073 K when measured along. The ZT value is further increased to 0.8 with a small amount (2% substitution for Re) of Mo addition.
机译:(1)由于底层C11_B格子中的Si位点的空位排列,确定Resi_(1.75)的晶体结构是与空间组CM(MC44)的单斜视。晶体含有四个不同定向的域;通过关于底层C11_B晶格的C轴和两个域的双域的C轴相互相关的两个域。 (2)用MO的合金化Resi_(1.75),将其在母体C11_B晶格中随机堆积不同化学组成和空位浓度堆叠的中非含量的微观结构。 (3)用Ru的合金resi_(1.75),剪切式微观结构,其中两个相邻结构域通过1/8的载体彼此彼此彼此剪切(移位),以增加Si空位浓度,出现。 (4)Resi_(1.75)的热电性能是高度各向异性的。除了用于的电阻率的值较高。当沿着时,它的电导却电导却器沿着P型均为p型。由于其相当复杂的晶体结构以及来自复杂的微结构,因此这种各向异性可能来自电子结构中的各向异性。 (5)尽管塞贝克系数的值沿着适度高(150-200μV/ k),但它沿(250-300μV/ k)非常高。导热率的值相当各向同性和合理的小。结果,在测量时,在1073k处实现0.7的非常高值的0.7的优选(Zt)。 ZT值进一步增加到0.8,Mo添加的少量(2%替换为2%)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号