High resolution photothermal microscope : A very sensitive tool for the detection of nano-scale isolated absorbing defects in optical coatings

摘要

Photothermal deflection technique permits to highlight the presence of absorbing defects in optical components. This non-destructive tool is of a great interest to understand the role of impurities in laser-induced damage process. The detection of nano-sized isolated inclusions requieres to develop a very sensitive photothermal setup. Thus, it is essential to improve the detection up to its theoretical limit.