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Precision measurement of carriage straightness and tilt error motions of an ultra-precision aspheric grinding machine

机译:超精密非球面磨机的托架直线度和倾斜误差运动的精确测量

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A capacitance probe-based system is developed for measurement carriage straightness and roll error motions. The system which is added to a conventional laser interferometer for yaw and pitch measurement, consists of a probe-unit and an auxiliary flat surface. The probe-unit, which is kept stationary, has three capacitance probes. The three probes are aligned in such a way that two aligned along the X-axis (X-probes) and two aligned along the Y-axis (Y-probes). The profile error of the flat surface, which is moved by the carriage, is first measured with the X-probes accurately through separating the carriage lateral straightness error (Z-error). The auxiliary flat surface is then used as an accurate reference for carriage lateral straightness error measurement. The roll error of the carriage can be measured by dividing the difference of the Y-probes by the probe distance between the Y-probes. The developed system has been applied to the measurement of an ultra-precision aspheric grinding machine. The straightness error and roll error were measured to be 140nm and 2.4arcsec over a stroke of 80mm, respectively.
机译:基于电容探头的系统开发用于测量托架直线和滚动误差运动。将其添加到传统激光干涉仪的系统用于偏航和俯仰测量,包括探针单元和辅助平坦表面。保持静止的探头单元具有三个电容探头。三个探针以这样的方式对准,使得沿X轴(X探针)对准,沿Y轴(Y探针)对齐两个。首先通过分离托架横向直线误差(Z误差),首先用X探针测量托架的平面的轮廓误差。然后将辅助平坦表面用作托架横向直线误差测量的准确参考。可以通过将Y探针的探针差除以Y探针之间的探针来测量托架的滚动误差。开发系统已应用于超精密非球面磨机的测量。直接误差和滚动误差分别在80mm的行程中测量为140nm和2.4arcsec。

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