首页> 外文会议>International Conference of the European Society for Precision Engineering and Nanotechnology >Long Distance Microscope for Measurement of Tool Shape in High Precision X-Y Turning
【24h】

Long Distance Microscope for Measurement of Tool Shape in High Precision X-Y Turning

机译:高精度X-Y转动测量的长距离显微镜测量工具形状

获取原文
获取外文期刊封面目录资料

摘要

The problems of out of roundness, wear, and cracking of cutting tools used in high precision x-y-turning is solved by a variable magnification microscope. This is built by a long distance microscope lens and a variable magnification TV lens coupled to a CCD-camera, frame grabber and computer. Resolution below 1 micrometer is achieved. Wear, cracking and built up cutting edge can easily be detected, form measurement takes some more effort. This microscope is fixed to the machine frame thus establishing a machine Null. The tool is moved by the x-y drive of the machine to any inspection position. As the field of view is limited images from tools bigger than 0.5 mm have to be stitched to give a complete image.
机译:在高精度X-Y转弯中使用的圆度,磨损和开裂的问题通过可变放大率显微镜解决。这是由长距离显微镜镜片和可变放大电视镜头构建的,耦合到CCD相机,帧抓取器和计算机。实现了低于1微米的分辨率。磨损,开裂和建立的切削刃可以很容易地检测,形成更多的努力。该显微镜固定到机架上,从而建立机器零。该工具由机器的X-Y驱动器移动到任何检查位置。由于视野是从大于0.5 mm的工具的有限图像,必须缝合以提供完整的图像。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号