Noise in imaging systems: Fixed pattern noise, electronic and interference noise

摘要

Imaging digital systems are widely used nowadays. CCD and CMOS sensors are embedded in a lot of metrologic devices for metrology in a lot of devices. One of these applications is the characterization of laser beams. For these kinds of applications, it is necessary to use cameras with high dynamic range. Some algorithms have been proposed in the past for this purpose. But, normally they enhance not only the dynamic range but the noise sensor too. In this paper we have applied an automatic algorithm to classify the different noise processes appearing in a CCD matrix. The method is based on a principal component expansion of the covariance matrix of some frames taken with the camera. It is possible to classify not only non-uniformity noise of the detector matrix, but also those contributions due to electronics and electronic interference and vibrations. Some of these noise processes represent only a very low amount of the total noise. A method to filter these noises is also presented.