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Closed-Loop Performance Measures for Flight Controllers Subject to Neutron-Induced Upsets

机译:以中子引起的upsets受飞行控制器的闭环性能测量

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摘要

It has been observed that atmospheric neutrons can produce single event upsets in digital flight control hardware. The phenomenon has been studied extensively at the chip level, and now system level experiments are underway. In this paper analytical closed-loop performance measures for the tracking error are developed for a plant that is stabilized by a recoverable computer system subject to neutron induced upsets. The underlying model is a Markov jump-linear system with process noise. The steady-state tracking error is expressed in terms of a generalized observability Gramian.
机译:已经观察到大气中子可以在数字飞行控制硬件中产生单一事件扰乱。该现象已经在芯片水平上广泛研究,现在正在进行系统水平实验。在本文中,用于跟踪误差的分析闭环性能措施,用于由受中子诱导的扰动的可收回计算机系统稳定的工厂开发的。底层模型是具有过程噪声的马尔可夫跳跃线性系统。稳态跟踪误差以广义可观察性克朗尼亚人表示。

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