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Time Domain Terahertz Spectroscopy of the Magnetic Field Induced Metal-Insulator Transition in n:InSb

机译:时域的磁场诱导金属绝缘体转换中的时域太赫兹光谱法N:INSB

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Temperature (T) and frequency () dependent conductivity measurements are reported for n-type indium antimonide (InSb) around the magnetic field induced metal-insulator transition (MIT). For the sample with electron density n= 2.15×1014 cm–3, the critical field is observed at ~0.7 T in dc transport measurements. The frequency dependent conductivity (w) measured via terahertz time domain spectroscopy indicates a higher critical field ~1.2 T. Both dc(T) and 1(w) at low temperatures show power law dependence with exponents of α=1.2.
机译:报告温度(T)和频率()依赖性电导率测量对于磁场诱导金属 - 绝缘体转换(MIT)周围的N型铟抗衍生物(INSB)。对于具有电子密度n = 2.15×1014cm-3的样品,在直流传输测量中观察到临界场。通过太赫兹时域光谱测量的频率依赖性电导率(W)表示低温下的DC(T)和1(W)的更高临界场〜1.2 T.α= 1.2的指数显示电力法依赖性。

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