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Ferromagnetic State of GdN Thin Film Studied by Ferromagnetic Resonance

机译:铁磁共振研究的GDN薄膜的铁磁状态

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摘要

Magnetic semiconductor GdN thin film has been studied by a conventional X-band electron spin resonance (ESR). Electron paramagnetic resonance (EPR) of GdN is observed at 100 K while the ferromagnetic resonance (FMR) is clearly observed at 4.2 K, which is confirmed by the typical angular dependence of FMR. The result will be discussed in connection with the magnetic properties obtained previously by our SQUID magnetometer measurement.
机译:通过传统的X波段电子旋转共振(ESR)研究了磁半导体GDN薄膜。在100 k下观察到GDN的电子顺磁共振(EPR),同时在4.2k下清楚地观察到铁磁共振(FMR),通过FMR的典型角度依赖性证实。结果将结合先前通过我们的鱿鱼磁力计测量获得的磁性进行讨论。

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