ON FAULT DIAGNOSIS OF ANALOGUE ELECTRONIC CIRCUITS WITHACCESSIBILITY TO INTERNAL NODES BASED ON TRANSFORMATIONSIN MULTIDIMENSIONAL SPACES

摘要

In the paper new methods of fault localisation and identification in linear electronic circuits (two-port or multiport type) based on bilinear transformations in multidimensional spaces are presented. The novelty of these methods lies in transferring family of identification loci from a plane to multidimensional spaces. It implies greater distances between the loci and, in consequence, better fault resolution as well as robustness against non-faulty component tolerances and measurement errors. The methods can be used for diagnosis of electronic circuits in conventional testing systems and neural networks. They may be also useful in one or two-parameter identification measurements of other multi-parameter objects modelled by electrical circuits.