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DETECTION AND DIAGNOSIS OF SYSTEM NONLINEARITIES USING HIGHER ORDER STATISTICS

机译:使用高阶统计检测和诊断系统非线性

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This paper is concerned with the statistical analysis of closed loop data for diagnosing the causes of poor control loop performance. Higher Order Statistical (HOS) techniques have been developed over the last two decades, but until now have not been applied to the area of process monitoring. The main contribution of this work is to utilize the higher order statistical tools such as cumulants and their frequency domain counterparts (bispectrum, bicoherence, trispectrum) to detect and quantify the non-Gaussianity and nonlinearity of regulated processes or control error variables which are sometimes the main contributors to the poor performance of many of the control loops. The bicoherence index together with the process and manipulated variable plots are used to diagnose the sources of system nonlinearities. Successful application of the proposed method is demonstrated on simulated as well as industrial data.
机译:本文涉及对闭环数据的统计分析,用于诊断控制回路性能差的原因。在过去的二十年中已经开发了高阶统计(HOS)技术,但直到现在尚未应用于过程监控领域。这项工作的主要贡献是利用更高阶统计工具,例如累积剂及其频域对应物(BISPectrum,双相,三谱)来检测和量化受调节过程或控制误差变量的非高斯性和非线性,有时是主要贡献者对许多控制循环的性能不佳。双轴缩放指数与过程和操纵可变地块一起用于诊断系统非线性的来源。在模拟和工业数据上证明了所提出的方法的成功应用。

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