Given LMS cone quantum catches from a surface under a first illuminant what is the best method of predicting what the corresponding quantum catches will be for the same surface under a second illuminant given only the quantum catches of a white surface under both illuminants? The von Kries rule is one well known method. In this paper, two new prediction methods along with a variation on an existing third method are introduced and then compared experimentally. In contrast to the von Kries rule which is equivalent to a diagonal transformation, all three methods estimate a full 3-by-3 linear transformation mapping LMS values between illuminants. All the new methods perform better than the von Kries rule.
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机译:给定第一发光物下的表面捕获的LMS锥形量子是预测相应量子捕获在第二发光剂下的相应表面的最佳方法是仅在两个光照下给出的量子捕获量的相同表面? von Kries规则是一种众所周知的方法。在本文中,引入了两种新的预测方法以及现有第三种方法的变化,然后进行实验比较。与von Kries规则相比相当于对角线变换,所有三种方法估计光源之间的完整3×3线性变换映射LMS值。所有新方法都比von Kries规则更好。
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