首页> 外文会议>International Conference on Environmental Remediation and Radioactive Waste Management >DIFFERENT PATHWAYS OF SECONDARY PHASE FORMATION INDUCED BY COLLOIDAL AND DISSOLVED SILICA DURING THE DISSOLUTION OF UO_2 NUCLEAR FUEL IN LEACHING TESTS
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DIFFERENT PATHWAYS OF SECONDARY PHASE FORMATION INDUCED BY COLLOIDAL AND DISSOLVED SILICA DURING THE DISSOLUTION OF UO_2 NUCLEAR FUEL IN LEACHING TESTS

机译:胶体和溶解二氧化硅在浸出试验中的溶解期间胶体和溶解二氧化硅诱导的不同途径

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We investigated the different dissolution behaviour of UO_2 nuclear fuel material in waters containing silica in two different physical and chemical forms (dissolved ions and as SiO_2 colloids, respectively) at elevated temperatures (95°C in autoclaves). It was investigated if SiO_2 colloids can act as carrier material for U ions during a interface geochemical dissolution process, a process that might possibly enhance the mobilization of uranium. Herefore, leaching / dissolution tests were conducted in batch reactors, using both dissolved Si (sodium metasilicate solution), as well as synthetic SiO_2 colloids (100 nm diameter). Solid materials were examined with scanning electron microscopy (SEM-EDX) after the tests and ICP-OES was used for analysis of concentrations of U and Si in solutions. Thermodynamic calculations were applied for modelling the surface charges of the solid materials. Results show that a treatment with colloidal SiO_2 has different effects on the surfaces than a leaching in dissolved silicate solutions. In the presence of colloids, well-crystallized secondary phases containing U and Si (most obviously uranyl silicates) were found on the surfaces, which were attacked by the treatment. This was not the case when dissolved Si was used. SiO_2 colloids were partly found to remain on the surfaces after 1000 h at 95°C. Dissolved U concentrations decreased with increasing Si content in the systems, especially so when colloidal Si was used. Ultrafiltration showed that the greatest part of the dissolved U was associated with Si colloids. A surface charge model suggests that the different effects are due to the development of electrostatic interactions between the UO_2 and SiO_2 surfaces.
机译:我们研究了在含有两种不同的物理和化学形式(分别溶解离子和作为SiO_2胶体的溶解离子和作为SiO_2胶体)在升高的温度下(高压釜中的SiO_2胶体)的不同溶解行为。研究了它,如果SiO_2胶体可以在接口地球化学溶解过程中用作U离子的载体材料,这是可能增强铀的动员的过程。因此,使用溶解的Si(碳酸钠溶液)以及合成的SiO_2胶体(100nm直径),在分批反应器中进行浸出/溶解试验。用扫描电子显微镜(SEM-EDX)检查固体材料,在测试和ICP-OES用于分析溶液中U和Si的浓度。施加热力学计算,用于对固体材料的表面电荷进行建模。结果表明,用胶体SiO_2治疗对表面不同的效果而不是溶解的硅酸盐溶液中的浸出。在胶体存在下,在表面上发现含有U和Si(最明显亚烷基硅酸盐)的良好结晶的二次相,这些抗体被治疗攻击。当使用溶解的Si时,这不是这种情况。部分发现SiO_2胶体在95℃下1000小时后保留在表面上。溶解U浓度随着系统中的含量增加而降低,特别是当使用胶体Si时。超滤表明,溶解U的最大部分与Si胶体有关。表面电荷模型表明不同的效果是由于UO_2和SiO_2表面之间的静电相互作用的发展。

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