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Dealing with clutter in EMI inversion and classification schemes for buried UXO discrimination

机译:处理EMI反转和分类方案的杂乱,埋设uxo歧视

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Virtually all signal processing strategies for discrimination of buried UXO are clutter limited. Most buried UXO are to be found in the top meter of soil, and therefore produce detectable electromagnetic responses. However they also typically reside in settings with widespread metallic clutter from detonated ordnance or other sources. While generally smaller than the UXO, metallic fragments can be numerous and may be shallower than the UXO we seek. Thus clutter signals may be stronger than those from UXO, especially locally, and may cause either highly localized or diffuse obscuration of signatures. They may mask crucial UXO frequency and temporal response patterns, and may distort the otherwise revealing spatial variations of response. To deal with this, first an analytical physical model of electromagnetic induction (EMI) scattering from widespread metallic clutter is formulated and tested. The dependence of signal magnitude on antenna elevation is determined for both thin surface layers and volume layers of clutter. This dependence is different from that of a single UXO size target. In treatment of UWB EMI measurements, this difference is exploited to elicit evidence of the UXO-like target when it is screened from the sensor by a surface layer of small metallic objects. Inversions are also performed for characterizing the geometry of a UXO-like target beneath a surface layer of clutter. The test cases compare a simple least squares (SLS) and a Bayesian-inspired statistical (BIS) approach. As target depth is increased and signal to clutter ratio decreases, the BIS generally produces more consistent and accurate results.
机译:实际上,用于掩埋UXO的歧视的所有信号处理策略都是Clutter Limited。大多数埋藏的UXO将在土壤上找到,因此产生可检测的电磁反应。然而,它们通常也驻留在具有来自爆炸的刚性或其他来源的广泛金属杂波的环境中。虽然一般小于UXO,但金属片段可能很多,可能比我们寻求的UXO浅。因此,杂波信号可能比来自UXO,尤其在本地的杂波信号更强,并且可能导致高度局部或漫射遮蔽的签名。它们可以掩盖关键的UXO频率和时间响应模式,并且可以扭曲其他露出响应的空间变化。为了处理这一点,制定并测试了从广泛金属杂波的电磁感应(EMI)散射的分析物理模型。针对两种薄表面层和杂波的体积层确定信号幅度对天线高度的依赖性。这种依赖性与单个UXO大小目标的依赖性不同。在治疗UWB EMI测量时,在通过小金属物体的表面层从传感器筛选时,这种差异被利用以引出UXO样目标的证据。还执行逆转,用于表征杂波的表面层下方UXO样目标的几何形状。测试用例比较简单的最小二乘(SLS)和贝叶斯激发统计(BIS)方法。随着目标深度的增加并且信号与杂波比降低,BIS通常产生更一致和准确的结果。

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