Testability has been introduced for solving problems in electronic equipment, especially in Aeronautics and Astronaut's electronic equipment. With the development of engineering technology, testability becomes one of the important contents of modern engineering equipment design. The test performance and fault diagnosis capacity of equipment system can be improved consumedly by testability designing. However, the former testability theory is based on the build in test (BIT) and failure rate analysis. It is not suitable for ES. The state degradation analysis (SDA) is one of the new research fields in recent years. Quantization and operability of testability can be solved with this method. In this paper, the testability of ES is studied based on the SDA. The factors that have influence on determining testability parameters are found out. Parameter system of testability measuring to ES is presented. And definition of every parameter is determined.
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