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Design of Single-chip Microcomputer in Alternating Electric Parameters Measuring

机译:交替电气参数测量中单芯片微电脑的设计

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摘要

In electronic technology field, some parameters such as three phase voltage, electron current, frequency, period, phase difference angle, active power, inactive power, apparent power etc. need be measured. The past measuring methods need many various instruments. The operations such as testability, read parameter, record etc. must be completed by man. The shorts are precision is lower and error is larger. The paper designs an alternating electric parameters measuring instrument in which the above-mentioned various parameters can simultaneously be test. It can read accurately, operate simply and can automatically record result of testability. This paper give hardware design principle chart and program design thought. The system use MCS-51 microcomputer. As the crystal vibration frequency of SCM is higher (11.059MHZ) , its presetting time of TR0 and TR1 can reach microsecond degree, we can get higher precision of all parameters and wider measurement range. The software design for the system has many features and hardware design is very simple. As the issue of alternating electric parameters measurement is always concerned about, the method put forward by the paper is practical, therefore, the system can be extended to other fields conveniently.
机译:在电子技术领域,需要测量诸如三相电压,电子电流,频率,周期,相位差角,有功功率,非活动功率,表观功率等的一些参数。过去的测量方法需要许多各种仪器。人类必须完成可测试性,读取参数,记录等的操作。短裤是精度较低,错误较大。本文设计了一种交替的电气参数测量仪,其中可以同时测试上述各种参数。它可以准确读取,简单操作,可以自动记录可测试性的结果。本文给出了硬件设计原理图表和节目设计思想。系统使用MCS-51微计算机。随着SCM的晶振频率更高(11.059MHz),TR0和TR1的预置时间可以达到微秒,我们可以获得更高的所有参数和更广泛的测量范围的精度。系统的软件设计具有许多功能和硬件设计非常简单。由于交替电气参数测量的问题始终涉及,本文提出的方法实用,因此,系统可以方便地扩展到其他领域。

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