Diffusion of foreign cations in stabilized zirconia

摘要

Diffusion of several cationic impurities (Ni, Mn, La, Sr, Y) from SOFC (solid oxide fule cell) electrodes (Ni: anodel; M, La, Sr, Y: cathode) into stabilized zirconia (yttria stabilized ZrO_2, YSZ, and calcia stabilized ZrO_2, CSZ) were measured with SIMS as a function of temperature (1200 to 1450 deg C) and stabilizer content (10 to 24 molpercent Y_2O_3; 11 and 17 molpercent CaO).