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Optical Imaging of Objects Within Highly Scattering Media Using Silicon Micromachined Collimating Arrays

机译:使用硅微机械准直阵列高度散射介质内物体的光学成像

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Optical imaging of objects within highly scattering media requires the detection of ballistic/quasiballistic photons through these media. Recent works have used Phase/Coherence Domain or Time Domain Tomography (femtosecond pulses) to detect the shortest path photons through scattering media. Our collimation detection uses Small Acceptance Angle Devices to extract photons emitted within a small source angle. This work employs a high aspect, micromachined collimating detector array fabricated by high-resolution silicon surface micromachining. Consider a linear collimating array of very high aspect ratio (200:1) containing 51*1000 μm etched channels with 102 μm spacing over a 10 mm silicon width. With precise array alignment to a laser source, unscattered light passes directly through the channels to the CCD detector and the channel walls absorb the scattered light at angles >0.29°. Objects within a scattering medium were scanned quickly with a computer-controlled Z-axis table. High-resolution images of 100 μm wide lines and spaces were detected at scattered-to-ballistic ratios of 500,000:1. At >5,000,000:1 ratios, a uniform background of scattered illumination degrades the image contrast unless recovered by background subtraction. Simulations suggest smaller channels and longer arrays could enhance detection by factors greater than 100. Detection using Silicon Micromachined Collimating Arrays are also nearly wavelength independent.
机译:高度散射介质内物体的光学成像需要通过这些介质检测弹道/准光子。最近的作品已经使用相位/相干域或时域断层扫描(飞秒脉冲)来通过散射介质检测最短路径光子。我们的准直检测使用小型接受角装置来提取在小源角内发射的光子。这项工作采用高分辨率的微机械加固探测器阵列,由高分辨率硅表面微机械制造。考虑含有51×1000μm蚀刻通道的非常高纵横比(200:1)的线性准直阵列,其具有10mm宽度的102μm间距。对于激光源的精确阵列对准,未准备的光通过通道直接通过通道,并且通道壁在角度下吸收散射光> 0.29°。使用计算机控制的Z轴表快速扫描散射介质内的物体。以500,000:1的散射对弹道比检测为100μm宽线和空间的高分辨率图像。在> 5,000,000:1比率,除非由背景减法恢复,否则散射照明的均匀背景会降低图像对比。仿真表明较小的通道和更长的阵列可以通过大于100的因素来增强检测。使用硅微机械准直阵列的检测也几乎与波长无关。

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