In order to minimize the pollution problem and to conserve the limited natural resources, a method is developed in this study to recover the precious metals contained in the scrap Integrated Circuits. The main target metals of this study is the precious metals of gold, sliver and copper. Several different kinds of scrap Integrated Circuits were collected and analyzed for this study. These samples were then subjected to a series of tests of roasting, grinding, mixing, magnetic separation and screening. After aforementioned tests, for those fractions of non-ferrous and size smaller than 50 mesh were collected and mixed for further leaching tests. Four leaching solutions of sulfuric acid, ammonia, aqua regia and thiourea were adopted in this study to investigate the recovery efficiency of precious metals (i.e., gold, silver and copper) from these collected fine material under different leaching conditions (i.e., leaching time, temperature, concentration, ..etc.,). This paper will present the results of this study.
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