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Methodology for Predicting BGA Warpage by Incorporating Metal Layer Design

机译:通过结合金属层设计来预测BGA翘曲的方法

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This paper presents a methodology to predict warpage of ball grid array packages (BGAs) that takes into account details of metal designs in the multi layered substrate. Composite theory along with local homogenization methods are used to resolve the distribution of material properties in each layer of the substrate that enables an efficient simulation model with moderate computational size. Associated procedures have been implemented and tested for finite element simulation tool. Verification examples were prepared to demonstrate the warpage predictions on BGA packages. Key substrate parameters including package mold compound shrinkage during post mold cure and the resultant impact on deformation behavior and mechanical reliability of BGA assemblies. A comparison of simplified homogenization methods and representative unit cell models of multi layered composite structures are discussed and show the significance of incorporating detailed metal layer design in simulation model for accurate warpage prediction.
机译:本文提出了一种方法来预测考虑多层基板中的金属设计细节的球栅阵列包装(BGA)的方法。复合理论以及局部均质化方法用于解析衬底的每层材料的分布,这使得具有中等计算大小的有效仿真模型。已经实现了相关的程序并测试了有限元仿真工具。准备验证例证以展示BGA包上的翘曲预测。键基板参数包括后模具固化期间的包装模具复合收缩,并产生了对BGA组件的变形行为和机械可靠性的影响。讨论了多层复合结构的简化均化方法和代表单元电池模型的比较,并显示了在仿真模型中掺入精确翘曲预测的仿真模型中的重要性。

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