Single byte error control codes with double bit within a block error correcting capability for semiconductor memory systems

摘要

Computer memory systems when exposed to strong electromagnetic waves or radiation are highly vulnerable to multiple random bit errors. Under this situation, we cannot apply existing SEC-DED or S{sub}bEC capable codes because they provide insufficient error control performance. This correspondence considers the situation where two random bits in a memory chip are corrupted by strong electromagnetic waves or radioactive particles and proposes two classes of codes that are capable of correcting random double bit errors occurring within a chip. The proposed codes, called Double bit within a block Error Correcting -Single byte Error Detecting ((DEC){sub}B-S{sub}bED) code and Double bit within a block Error Correcting -Single byte Error Canceling ((DEC){sub}B-S{sub}bEC code, are suitable for recent computer memory systems.