Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics

摘要

We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X-Y zoning method. In the method, we cloud implement a diagnosis procedure based on a diagnostic method for digital circuits. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.