In this paper we present a new LFSR reseeding scheme for scan-based BIST suitable for circuits with random-pattern-resistant faults. The proposed scheme eliminates the need of a ROM for storing the seeds since the reseedings are performed dynamically by inverting some selected hits of the LFSR register. A time-to-market efficient algorithm is also presented for selecting the reseeding points in the test sequence, as well as a proper seed at each point. This algorithm targets complete fault coverage and minimization of the resulting test length and hardware overhead. Experimental results on ISCAS'85 and ISCAS'89 benchmark circuits demonstrate the advantages of this new LFSR reseeding approach in terms of area overhead and test application time.
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