A DSP BASED TEST SYSTEM FOR 'NOISE-SEPARATION' MEASUREMENTS ON ADC AND DAC SYSTEMS

摘要

This paper describes the design and application of a 'noise-separation' test system that uses in-system programmable logic devices and a digital signal processor. This offers a low cost approach to multi-tone testing of the wide-bandwidth linearity of both ADC and DAC systems. As the test signal bandwidth is software configurable and uses 1 bit D-A converters it can be applied to a much wider range of applications than more conventional multi-tone test methods. Time-domain processing is expected to provide meaningful results for routine tests in a much shorter time than with FFT analysis.