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The study and analysis of the conducted EMI suppression on power MOSFET using passive snubber circuits

机译:使用无源缓冲电路对电源MOSFET进行EMI抑制的研究与分析

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This paper presents the study and analysis of RCD, RLD, and RCD-RLD passive snubber circuits affect to the power losses and the suppression of the conducted EMI emission on the power MOSFET. The paper describes the snubber effects on dv/di during turn-off period, di/dt during turn-on period, over voltage, spike voltage, power loss and the conducted EMI emission. The 100 watts -50 kHz buck converter is used in the simulation and the in experiment. The measured and simulated results of conducted EMI emission are compared to verify the effectiveness of the each snubber circuits.
机译:本文介绍了RCD,RLD和RCD-RLD被动缓冲电路的研究和分析对功率损耗的影响以及功率MOSFET上进行了EMI发射的抑制。本文介绍了在接通时段,导通时段的截止周期,DI / DT期间对DV / DI的缓冲效应,过电压,尖峰电压,功率损耗和进行的EMI发射。 100瓦-50 kHz降压转换器用于模拟和实验中。比较了所进行的EMI发射的测量和模拟结果以验证每个缓冲电路的有效性。

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