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Characterizing dynamic and leakage power behavior in flip-flops

机译:在触发器中表征动态和泄漏功率行为

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This paper presents a detailed analysis of power consumption in a variety of flip-flop designs including scannable latches. The analysis was performed by implementing and simulating the different designs using 7Onm, 1V CMOS technology. First, we perform a detailed characterization of the dynamic power consumption due to output transitions and that due to clock and data transitions when there is no output transition. Further, we also characterize the leakage behavior of each of the flip-flop designs and specifically, characterize the input dependence of leakage.
机译:本文提出了各种触发器设计中的功耗的详细分析,包括可扫描的闩锁。通过使用7onm,1V CMOS技术实施和模拟不同设计来进行分析。首先,我们在输出转换引起的动态功耗的详细表征,并且由于没有输出转换时的时钟和数据转换而导致的动态功耗。此外,我们还表征了每个触发器设计的泄漏行为,具体地表征了泄漏的输入依赖性。

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