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Fabrication of piezoelectrically driven micro-cantilever using Pb(Zr, Ti)O/sub 3/ films

机译:使用PB(Zr,Ti)O / Sub 3 /薄膜制备压电驱动的微悬臂仪

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Piezoelectrically driven micro-cantilevers using Pb(Zr, Ti)O/sub 3/ (PZT) films have been successfully fabricated by bulk micro-machining. PZT thin films were made by sol-gel process using a 1-3 propanediol and modified alkoxide precursors. The cantilever structures consist of piezoelectric PZT capacitors fabricated on a low stress SiN/sub x/ supporting layer. Flat micro-cantilever has been obtained by controlling the stress in Pt electrode and PZT layers. The dielectric constant and loss of the PZT thin films in the cantilever structure were 1000 and 2% at 100 kHz, respectively. The remanent polarization was 20 /spl mu/C/cm/sup 2/. The microcantilever had a dc response of 84 nm/V. The microcantilevers had a resonant frequency of 19.5 kHz and the corresponding displacement of 2.97 /spl mu/m at the applied bias of 1 V.
机译:使用PB(Zr,Ti)O / Sub 3 /(PZT)膜的压电驱动的微悬臂用于通过散装微加工成功制造。 PZT薄膜通过溶胶 - 凝胶工艺制备,使用1-3丙二醇和改性醇盐前体进行。悬臂结构包括在低应力SIN / SUB X /支撑层上制造的压电PZT电容器。通过控制PT电极和PZT层中的应力来获得扁平的微悬臂。悬臂结构中PZT薄膜的介电常数和损失分别为100kHz,分别为1000℃,2%。结垢极化为20 / SPL mu / c / cm / sup 2 /。微电机具有84nm / v的直流响应。微电子频率为19.5kHz的谐振频率,并且在施加的偏压下具有2.97 / SPL MU / M的相应位移。

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