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X-Ray Stress Measurement of Ni-AI system Coating Layer Prepared by Self-Propagating High-Temperature Synthesis Reaction

机译:通过自蔓延高温合成反应制备的Ni-AI系统涂层的X射线应力测量

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Ni-AI intermetallic compound is difficult to produce due to its high melting point, but can be produced usually the combustion synthesis reaction method called the SHS method. We made Ni-Al coating material on metal substrate using this technique, which generated residual stress generated near coating-substrate interface, due to the difference in component mechanical properties. In this study, the X-ray (sinψ)~2 technique was applied to study the, influences of coating thickness and substrate material property on the residual stress in the Ni-AI coating layer. As expected the level of residual stress caused by difficultly due to the differential mechanical properties between coating and substrate affects the joining quality. These residual stresses are generated during preparation by difference in the coefficient of thermal expansion between coating layer and substrate.
机译:由于其高熔点,难以产生Ni-AI金属间化合物,但通常可以生产燃烧合成反应方法,称为SHS方法。我们使用该技术在金属基材上制造了Ni-Al涂层材料,该技术产生了涂层衬底界面附近产生的残余应力,由于部件机械性能的差异。在该研究中,应用X射线(SINν)〜2技术来研究涂层厚度和基底材料性质对Ni-AI涂层中的残余应力的影响。由于涂层和衬底之间的差动力学性能难度地难以造成的残余应力水平影响接合质量。在涂层和基板之间的热膨胀系数的差异期间产生这些残余应力。

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