首页> 外文会议>IEEE International Conference on Solid Dielectrics >Test stand for high voltage insulator partial discharge testing with ultra short X-ray pulses
【24h】

Test stand for high voltage insulator partial discharge testing with ultra short X-ray pulses

机译:高压绝缘子局部放电测试的试验台,具有超短X射线脉冲

获取原文

摘要

Top quality high voltage pre-test of solid insulating material requires long test intervals because the initiation of partial discharge (PD) in voids not only demands a sufficiently high electric field, but also the availability of a start electron. The latter leads to a statistical distribution of the time to PD inception, such that long test intervals are required to rule out the presence of voids. This makes 100% screening economically infeasible. However, if the PD is activated using ionizing radiation, the necessary test interval can be reduced to a minimum, without risking that small voids will be missed. It has already been shown that pulsed X-rays are able to trigger PD in voids and not affect the measured PD magnitude. Based on this method, known as Pulsed X-ray Induced Partial Discharge (PXIPD), a test stand for routine testing of insulators up to 420 kV has been developed and put into commercial operation. A very low measurement noise level permits an automatic analysis of the results. Already more than 20,000 insulators for installation in GIS have been screened using this PXIPD method on an industrial scale. Investigation of insulators with natural defects demonstrates the effectiveness and reliability of this new system. In combination with the short test cycle time and the ability to unambiguously link PD to a specific insulator the system allows for a leaner GIS production.
机译:顶部质量高压固体绝缘材料的高压预测试需要长时间的测试间隔,因为空隙中的局部放电(Pd)的启动不仅要求高电场,而且还需要启动电子的可用性。后者导致时间分布到PD初始化的时间,使得需要长的测试间隔来排除空隙的存在。这使得100%筛选在经济上不可行。然而,如果使用电离辐射激活PD,则可以将必要的测试间隔减少到最小值,而不会冒着小空隙错过的情况。已经表明,脉冲X射线能够在空隙中触发PD并且不影响测量的PD幅度。基于该方法,已知为脉冲X射线诱导的局部放电(PXIPD),已经开发出高达420kV的绝缘体的常规测试的测试台并投入商业操作。非常低的测量噪声水平允许自动分析结果。在工业规模上使用该PXIPD方法已经筛选了在GIS中安装了超过20,000个安装的绝缘子。具有自然缺陷的绝缘子的调查表明了这一新系统的有效性和可靠性。结合短测试循环时间和明确地将PD连接到特定绝缘体的能力,该系统允许精简GIS生产。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号