ATOMIC FORCE AND ELECTRON MICROSCOPY STUDIES OF TIN DIOXIDE FILMS PREPARED FROM SOLUTIONS WITH HIGH FLUORINE CONTENT

摘要

Atomic force microscopy and electron microscopy were used to study surface and structural properties in SnO_2:F thin films deposited by spray pyrolysis on glass at a constant substrate temperature. The influence of high levels of fluorine in the starting solution on the surface topology and morphology of thin films and correlations with electrical properties are presented in this work.