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Fast deposition of μc-Si:H films from Ar-diluted SiH{sub}4 plasma in RF glow discharge

机译:从rf闪光放电中的Ar稀释的SiH {sih {sih {sih {sih} 4等离子体快速沉积μc-si:h膜

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Using Ar as diluent for SiH{sub}4 in RF glow discharge, we obtained undoped and doped μc-Si:H films having high σ{sub}D, low △E and low α; exhibiting sharp crystallographic rings in the electron diffraction pattern, c-Si grains of 100A diameter in the micrograph and intense Raman peak around 520 cm{sup}-1. The films were prepared at a remarkably high deposition rate of 50-70 A/min contributed from SiH{sub}4 having a flow rate of 1 SCCM, and hence it provides enormous promise towards an economic throughput in the fabrication of devices using this material.
机译:使用Ar作为稀释剂的SIH {Sub} 4,在RF发光放电中,我们的未掺杂和掺杂μC-Si:H膜具有高σ{sub} d,低ε和低α;在电子衍射图案中呈现尖锐的晶体环,在显微照片中为100A直径的C-Si颗粒和强烈的拉曼峰值约为520cm {sup} -1。以50-70a / min的显着高沉积速率制备薄膜,其从SIH {Sub} 4贡献为1 sccm的流速,因此它提供了使用该材料制造设备的经济产量的巨大希望。

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