THE PROBLEM OF THE STANDARD CHARACTERIZATION OF ADC AND DIGITIZING WAVEFORM RECORDERS

摘要

The problem of the metrological qualification of data acquisition systems and of waveform recorder is a fundamental issue for both users and manufacturers of digital instruments. The need for an improved industrial standard leading to unification and standardization in this field is a very pressing requirement. Users have to receive technical specifications written in standard format and manufacturers to obtain them following standard test procedure. The Main goal of this paper is to underline the need of unifying the modeling, identification and optimization of ADC-based systems, by minimizing the number of the experimental procedures to be employed.