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INTEGRATED SUPERCONDUCTING RECEIVER AS A TESTER FOR SUB-MILLIMETER DEVICES AT 400-600 GHz

机译:集成超导接收器作为400-600 GHz的子毫米器件的测试仪

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We report on design and first application of a laboratory-purpose tester which can in situ detect spectrum of sub-millimeter wave emission within frequency range of 400- 600 GHz from virtually any compact low-power source working within temperature range below 100 K. Both the receiver and the sample are placed in vacuum inside a laboratory test stick of diameter 50 mm, which is cooled down in a standard transport vessel for liquid helium. The sensor of the tester is designed on a base of the superconducting integrated receiver (SIR) chip working below 5 K. The chip sensor, beside the quasi-optical SIS mixer, contains an internal electronically tuned superconducting local oscillator, that provide low-noise operation at the level below 300 K DSB at central frequencies of 480-520 GHz as measured with a black body at the position of the test source. The signal detected by the SIS mixer is boosted by a helum-cold low-noise amplifier (G=20 dB, TN=10 K) within frequency range 1- 2 GHz and then by a second room temperature amplifier (G=53 dB, TN=90 K) both mounted within the same test stick. The output level is sufficient for direct application to most of standard RF recorders, e. g. for a spectrum analyzer. To detect weak signals, a compact chopper-wing has been designed and placed at the input of the receiver module. Details of design and main test data measured at DC and RF are reported.
机译:我们报告了一个实验室目的测试仪的设计和第一应用,该测试仪可以在400-600 GHz的频率范围内原位检测到400-600 GHz的频谱,几乎任何紧凑的低电源在高于100k的温度范围内工作接收器和样品在直径50mm的实验室试验杆内置于真空中,该试验杆在标准运输容器中冷却以进行液氦。测试仪的传感器设计在低于5K的超导集成接收器(SIR)芯片的基座上。芯片传感器在准光SIS混合器旁边包含内部电子调谐超导局部振荡器,可提供低噪声在480-520 GHz的中央频率下,在480-520 GHz的中央频率下测量,在测试源的位置测量。 SIS混频器检测的信号通过频率范围1- 2 GHz的Helum-Cold低噪声放大器(G = 20 dB,Tn = 10k)升压,然后通过第二室温放大器(G = 53 dB, Tn = 90 k)安装在同一测试棒中。输出电平足以直接应用于大多数标准RF记录器,例如。 G。对于频谱分析仪。为了检测弱信号,已经设计并放置在接收器模块的输入端并放置紧凑的斩波器。报道了DC和RF测量的设计细节和主要测试数据。

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