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Interferometric SAR to EO image registration problem

机译:干涉SAR到EO图像配准问题

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摘要

Historicially, SAR to EO registration accuracy has been atthe multiple pixel level compared to sub-pixel EO to EO registration accuracies. This is due to a variety o f factors including the different scattering characteristics of the ground for EO and SAR, SAR speckle, and terrian induced geometric distortion. One approach to imp[roving the SAR to EO registration accuracy is to utilize the full information from multiple SAR surveys using interferometric techniques. In this paper we will examine this problem in detail with an example using ERS SAR imagery. Estimates of the resulting accuracy based on ERS are included.
机译:历史上,与EO注册精度相比,SAR到EO注册准确度已经在多个像素级别。这是由于各种各样的因素,包括EO和SAR,SAR散斑和地下的地面的不同散射特性和地带诱导的几何变形。进程到解SAR到EO注册准确性的一种方法是利用来自干涉式技术的多个SAR调查的完整信息。在本文中,我们将通过使用ERS SAR图像的示例详细检查此问题。包括基于ERS的产生精度的估计。

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