An X-Ray Absorption Edge Detector for High-Resolution Measurement of Undulator Effective K-Parameter

摘要

The spectrum of angle-integrated undulator radiation displays a sharp edge at every harmonic photon energy. A technique utilizing this feature to measure minute changes in K-parameters of an undulator in a free-electron laser has been proposed. To date, this technique requires the use of crystal monochromators as bandpass filters whose energy centroid depends on the incident angle of the x-ray beam. In this work we propose to use the absorption edge of an appropriate element as an energy-selective detector whose response is truly independent of the angle of the x-ray beam, and hence independent of electron beam direction and emittance. We will discuss the basic design concept of the detection system and illustrate its projected performance with computer simulations.