This paper presents the experimental measurement of crosstalk effects in 0.18 /spl mu/m CMOS technology. Based on an on-chip measurement method, we characterize crosstalk on typical interconnect buses for different length of coupled lines, and deduce guidelines concerning critical coupled line length. The effect of the number of aggressors switching simultaneously, on the victim line, is also analyzed.
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机译:本文介绍了0.18 / SPL MU / M CMOS技术中串扰效应的实验测量。基于片上测量方法,我们在典型的互连总线上表征了不同长度的耦合线的串扰,并推导了关于关键耦合线长度的指导。还分析了侵略者的效果在受害线上同时切换。
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