The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineering productivity. A key factor is to achieve high and verifiablefault coverage for designs by closely adhering to guidelines and by increased test automation. This paper will address the design for test (DFT) aspects of the methodology, production testing of embedded CPU cores, and provides some data on completeddesigns.
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