FLICKER (P_(ST)~(LM)) AND STROBOSCOPIC EFFECT (SVM) - LIGHT MEASUREMENTS IN PHOTOMETRICAL LABORATORIES. SIGNIFY DEVELOPED SETUP AND VALIDATION METHOD

摘要

The document CIE TN 006:2016 - Visual Aspects of Time-Modulated Lighting Systems - Definitions and Measurement Models contains the description of current measures to evaluate Temporal Light Artifacts (TLA), including flicker and stroboscopic effects. From an industry perspective, there are several methods available to record optical waveforms and to evaluate these waveforms for TLA effects. These TLA metrics can be utilized to judge the quality of lighting products. The primary documents that are currently available for test and measurement of optical waveforms and TLA are: [1] National Electrical Manufacturers Association (NEMA) NEMA 77-2017 Temporal Light Artifacts: Test Methods and Guidance; [2] International Electrotechnical Commission (IEC) TR 61547-1:2017 ED2 Equipment for general lighting purposes - EMC immunity requirements - Part 1: An objective light flickermeter and voltage fluctuation immunity test method; and [3] (IEC) TR 63158:2018 Equipment for general lighting purposes - Objective test method for stroboscopic effects of lighting equipment. These three documents provide guidance for performing accurate measurements, but many laboratories struggle making consistent and accurate measurements of temporal light artefacts.