Curing behavior of phenolic resin/rubber systems by DSC, FT-IR, and atomic force microscopy

摘要

The curing behavior of phenolic resin/rubber Systems with different curing levels was investigated by DSC, FT-IR, and atomic force microscopy (AFM). Phenolic resin is one of the earliest synthetic resins to be used in construction, electric and other industries. However, unmodified phenolic resin is a brittle material with limited application. The phenolic resin/rubber system has been used to improve mechanical properties. Atomic force microscopy, a scanning probe microscopy (SPM) technique, provides three-dimensional images of surfaces on a microscopic scale. Related AFM techniques are force-distance plots, x-modulation, and z-modulation etc. DSC and Basic IR transmission was used to study the relationship between phenolic linkage reaction and time. The resulting reaction kinetics was compared with the adhesion force-distance curve data obtained via atomic force microscopy (AFM). The coordinated DSC/FTIR/ AFM approach is useful to elucidate the true curing behavior of this system and demonstrate the complimentary nature of the two techniques. As the cross-linking density of phenolic resins between each other increases, the sample should become less flexible and the response to a deformation should decrease. Using these techniques, we will present a detailed description of the curing mechanism in phenolic resin/rubber systems.