Check of the Local Structural Homogeneity of Quartz Specimens by X-Ray Diffraction Methods

摘要

The structural homogeneity of quartz bars has been studied by X-ray double-crystal topography and by a simple scan method ("orientation mapping"). The striking defects are single dislocations and orientation fluctuations of a few arcminutes. There are orientation differences between Z~+ and Z~- regions up to 1 arcmin. Therefore, the structural homogeneity of quartz should be checked during the different production stages. Several methods suited for this purpose are discussed. Among them, a topopographic technique with a CCD-line detector and automatic evaluation, as well as a simple orientation mapping using a divergent beam and a position sensitive detector, which can be applied as a completion of existing X-ray testing machines, are proposed as the most effective variants.